An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation

Author:

Sun Haijun,Zeng Yongjia,Li Pu,Lei Shaochong,Shao Zhibiao

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Reference34 articles.

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3. Basturkmen NZ, Reddy SM, Pomeranz I (Oct. 2002) Pseudo random patterns using Markov sources for scan BIST. In Proc. IEEE Test Symp., pp 1013–1021.

4. Bellos M, Bakalis D, Nikolos D (Feb. 2004) Scan cell ordering for low power BIST. In Proc. IEEE Computer society Annual Symp., pp 281–284.

5. Bhunia S, Mahmoodi H, Ghosh D, Mukhopadhyay S, Roy K (2005) Low-power scan design using first-level supply gating. IEEE Transactions on Very Large Scale Integration Systems 13(3):384–395

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