Soft Fault Classification of Analog Circuits Using Network Parameters and Neural Networks
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-013-5370-3.pdf
Reference8 articles.
1. Guo Z, Savir J (2006) Coefficient based test of parametric faults in analog circuits. IEEE Trans Instrum Meas 55:150–157
2. Jantos P, Grzechca D (2008) The influence of global parametric faults on analogue electronic circuits time domain response features. Proceedings of the IEEE-DDECS’08, Slovakia, Europe, April 16–18, 2008.
3. Kavithamani A, Manikandan V, Devarajan N (2009) Analog circuit fault diagnosis based on bandwidth and fuzzy classifier. Proceedings of international conference, IEEE—TENCON 2009, pp 1–6, Singapore, November 23–26, 2009.
4. Kavithamani A, Manikandan V, Devarajan N (2011) Analog circuit fault detection using location of poles. Int J Elec Test Theory Appl 27:673–678
5. Kavithamani A, Manikandan V, Devarajan N (2011) Improved coefficient based test for diagnosing parametric faults of analog circuits. Proceedings of International Conference: TENCON 2011, Bali, Indonesia, November 21–24, pp 1–5
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