Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter-Reference-Cited by-同舟云学术

Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter

Published:2020-04 Issue:2 Volume:36 Page:169-181
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Rathnapriya S.,Manikandan V.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

https://link.springer.com/content/pdf/10.1007/s10836-020-05870-9.pdf

Reference33 articles.

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4. Halgas S (2008) Multiple soft fault diagnosis of nonlinear circuits using the fault dictionary approach. Bulletin of the Polish Academy Sciences, Vol. 56, No. 1

5. Han L, Narendran N (2011) An accelerated test method for predicting the useful life of an LED driver. IEEE Trans Power Electron 26(8):2249–2257

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