Too Few or Too Many Properties? Measure it by ATPG!
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-007-5015-5.pdf
Reference26 articles.
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4. Clarke E, Grumberg O, McMillan K, Zhao X (1995) Efficient generation of counterexamples and witnesses in symbolic model checking. In: Proc. of ACM/IEEE DAC, pp 427–432
5. Chockler H, Kupferman O, Kurshan RP, Vardi MY (2001) A practical approach to coverage in model checking. In: Proc. of CAV, pp 66–78
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Concurrency-oriented verification and coverage of system-level designs;ACM Transactions on Design Automation of Electronic Systems;2011-10
2. Advanced verification by automatic property generation;IET Computers & Digital Techniques;2009
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