Author:
Subrahmaniyan Radhakrishnan Gurusubrahmaniyan,Ozev Sule
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference29 articles.
1. Acar E, Ozev S (2008) Defect oriented testing of RF circuits. IEEE Trans Comput-Aided Des Integr Circuits Syst 27(5):925–931
2. Akbay JTS, Rumer J, Chaterjee A, Amtsfield J (2006) Alternate test of RF frontend with IP constraints: frequency domain test generation and validation. In: IEEE ITC, pp 1–10
3. Bonnans J (2006) Numerical optimization: theoretical and practical aspects. Springer, Berlin
4. Dominguez M, Ausin J, Duque-Carrillo J, Torelli G (2006) A 1-MHz area efficient on-chip spectrum analyzer for analog testing. J Electron Test (Theory and Application) 22(4–6):437–448
5. Engin N, Kerkhoff H (2004) Fast fault simulation for non-linear analog circuits. IEEE Des Test Comput 20:40–47
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