Towards Fault-Tolerant RF Front Ends

Author:

Das Tejasvi,Gopalan Anand,Washburn Clyde,Mukund P. R.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Reference12 articles.

1. S. Byun, P. Chan-Hong, S. Yongchul, W. Sungho, C.S.G. Conroy, and K. Beomsup, “A Low-Power CMOS Bluetooth RF Transceiver with a Digital Offset Canceling DLL-Based GFSK Demodulator,” IEEE J. Solid-State Circuits, vol. 38, no. 10, pp. 1609–1618, October 2003.

2. H. Darabi et al., “A 2.4-GHz CMOS Transceiver for Bluetooth,” IEEE J. Solid-State Circuits, vol. 36, no. 12, pp. 2016–2024, December 2001.

3. T. Das, A. Gopalan, C. Washburn, and P.R. Mukund, “Towards Fault-Tolerant RF Front-Ends: On-Chip Input Match Self-Correction of LNAs,” Proceedings of the IEEE Mixed-Signal Test Workshop, June 2005.

4. J. Ferrario, R. Wolf, S. Moss, M. Slamani, “A Low-Cost Test Solution for Wireless Phone RFICs,” IEEE Commun. Mag., vol. 41, no. 9, pp. 82–89, September 2003.

5. A. Gopalan, P.R. Mukund, and M. Margala, “A Non-Intrusive Self-Test Methodology for RF CMOS Low Noise Amplifiers,” Proceedings of the IEEE Mixed Signal Test Workshop 2004, pp. 196–202, June 2004.

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