Reliability of FGM bulb type spacer in three-phase gas insulated busduct with protrusion and depression defects under particle contamination
Author:
Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s13198-024-02470-0.pdf
Reference19 articles.
1. Dasgupta S, Baral A, Lahiri A (2023) Optimization of electrode-spacer arrangement using simplex algorithm. IEEE Trans Dielectr Electr Insul 30(2):726–733. https://doi.org/10.1109/TDEI.2023.3242628
2. Du BX, Wang ZH, Li J, Liang HC, Li ZH (2020) Epoxy insulator with surface graded-permittivity by magnetron sputtering for gas-insulated line. IEEE Trans Dielectr Electr Insul 27(1):197–205
3. Fabio MR, Hidayat S, Khayam U (2021) Effects of notches in GIS spacer design to hold conductor rods on electric field distribution. In: 3rd International conference on high voltage engineering and power systems, ICHVEPS 2021, pp. 241–246. https://doi.org/10.1109/ICHVEPS53178.2021.9601002
4. Hayakawa N, Kato K, Hikita M, Okubo H, Watanabe K, Adachi K, Okamoto K (2020) Development of cone-type FGM spacer for actual size GIS. In: Annual report-conference on electrical insulation and dielectric phenomena, CEIDP, 2020-October, art. no. 9437434, pp. 255–258.https://doi.org/10.1109/CEIDP49254.2020.9437434
5. Inoue Y, Kozako M, Hikita M, Masui H, Yanase H, Okamoto K (2021) Effects of nano-micro composite and shielding on flashover characteristics of gas insulated switchgear spacer model in different lightning impulse application methods. In: Annual Report—conference on electrical insulation and dielectric phenomena, CEIDP, 2021-December, pp. 399–402, https://doi.org/10.1109/CEIDP50766.2021.9705320
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3