Surface and depth-profile analysis using FTIR spectroscopy-Reference-Cited by-同舟云学术

Surface and depth-profile analysis using FTIR spectroscopy

Published:1989-01 Issue:4-5 Volume:333 Page:353-359
ISSN:0016-1152
Container-title:Fresenius' Zeitschrift für analytische Chemie
language:en
Short-container-title:Z. Anal. Chem.

Author:

Oelichmann Joachim

Publisher

Springer Science and Business Media LLC

Subject

Clinical Biochemistry,General Materials Science,General Medicine,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00572327.pdf

Reference31 articles.

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2. Greenler RG (1966) J Chem Phys 44:310

3. Francis SA, Ellison AH (1959) J Opt Soc Am 49:131

4. Boerio JF, Chen SL (1979) Appl Spectrosc 33:121

5. Rabolt JF (1985) Vibrational spectroscopic studies of thin films. In: Durig JR (ed) Chemical, biological and industrial applications of infrared spectroscopy. Wiley, New York

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