Abstract
AbstractThis article presents an analysis of spurious signals’ influence on automatic frequency control (AFC) in EPR spectrometers. The primary source of spurious signals is leakage across the circulator in the microwave bridge. Additionally, the signals reflected from connectors in the line between the circulator and the resonator modify that signal. Spurious signals may degrade the performance of AFC, significantly offsetting lock points from the center frequency of the resonator. The offset’s size depends on the parameters of the resonator and the amount of the circulator isolation. It can be minimized by the appropriate use of a phase shifter located in the line between the circulator and the resonator. Another way to avoid these problems is to introduce a leakage compensation arm to the microwave bridge.
Funder
Jagiellonian University in Krakow
Publisher
Springer Science and Business Media LLC
Subject
Atomic and Molecular Physics, and Optics
Reference16 articles.
1. R.V. Pound, Electronic frequency stabilization of microwave oscillators. P Ire 34, W89–W89 (1946)
2. A. George, D. Teaney, Transistorized lock-in for klystron automatic frequency control. Rev Sci Instrum 31, 997–998 (1960)
3. T.H. Wilmhurst, Electron Spin Resonance Spectrometers (Springer, US, 2013).
4. J.S. Hyde, J. Gajdzinski, Electron-paramagnetic-res automatic frequency control-circuit with field-effect transistor (Fet) microwave amplification. Rev Sci Instrum 59, 1352–1356 (1988)
5. V. Krymov, G.J. Gerfen, Analysis of the tuning and operation of reflection resonator EPR spectrometers. J Magn Reson 162, 466–478 (2003)
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