Author:
,Bertolotto L.,Buzzo A.,Debevec P. T.,Drijard D.,Easo S.,Eisenstein R. A.,Eyrich W.,Ferro-Luzzi M.,Franz J.,Geyer R.,Hamann N.,Harris P.,Hertzog D. W.,Hughes S. A.,Johansson T.,Jones R.,Kilian K.,Kirsebom K.,Klett A.,Korsmo H.,Vetere M. Lo,Macri M.,Marinelli M.,Mouellic B.,Oelert W.,Ohlsson S.,Palano A.,Passaggio S.,Perreau J. M.,Pia M. G.,Pomp S.,Reimer P. E.,Ritter J.,Robutti R.,Röhrich K.,Rook M.,Rössle E.,Santroni A.,Schmitt H.,Steinkamp O.,Stinzing F.,Stugu B.,Tscheulin M.,Wirth H.,Zipse H.
Publisher
Springer Science and Business Media LLC
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