Refinement of GaAs powder diffraction data-Reference-Cited by-同舟云学术

Refinement of GaAs powder diffraction data

Published:1989-12 Issue:12 Volume:8 Page:1458-1460
ISSN:0261-8028
Container-title:Journal of Materials Science Letters
language:en
Short-container-title:J Mater Sci Lett

Author:

Razik N. A.,Al-Barakati G.,Al-Heneti S.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00720223.pdf

Reference17 articles.

1. B. RAY, ?International Series of Monographs in the Science of Solid State?, Vol. 2, ?II?VI Compounds? (Pergamon Press, Oxford, 1969).

2. R. L. SNYDER,Adv. X-ray Anal. 26 (1983) 1.

3. JCPDS International Center for Diffraction Data (Swathmore, Pennsylvania, USA).

4. C. R. HUBBARD, in ?Accuracy in Powder Diffraction?, edited by S. Block and C. R. Hubbard. US National Bureau of Standards Special Publication 567 (NBS, 1980) p. 489.

5. N. A. RAZIK,Appl. Phys. A37 (1985) 187.

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