Role of free carriers in the application of optically detected magnetic resonance for studies of defects in silicon-Reference-Cited by-同舟云学术

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Role of free carriers in the application of optically detected magnetic resonance for studies of defects in silicon

Published:1991-08 Issue:2 Volume:53 Page:130-135
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Chen W. M.,Monemar B.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00323872.pdf

Reference33 articles.

1. B.C. Cavenett: Adv. Phys. 30, 475 (1981)

2. W.M. Chen, B. Monemar, M. Godlewski: Defect and Diffusion Forum 62/63, 133 (1989)

3. G.D. Watkins: Proc. Int. Workshop on the Hyperfine Interaction of Defects in Semiconductors, Cargése, France, Aug. 27?31, 1990, to be published

4. J.M. Spaeth: Proc. Int. Workshop on the Hyperfine Interaction of Defects in Semiconductors, Cargése, France, Aug. 27?31, 1990, to be published

5. K.M. Lee, K.P. O'Donnell, J. Weber, B.C. Cavenett, G.D. Watkins: Phys. Rev. Lett. 48, 37 (1982)

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