Noninvasive Microelectrode Ion Flux Estimation Technique (MIFE) for the Study of the Regulation of Root Membrane Transport by Cyclic Nucleotides
Author:
Publisher
Humana Press
Link
http://link.springer.com/content/pdf/10.1007/978-1-62703-441-8_7
Reference49 articles.
1. Sanders D, Pelloux J, Brownlee C, Harper JF (2002) Calcium at the crossroads of signaling. Plant Cell 14:S401–S417
2. Thiel G, Weise R (1999) Auxin augments conductance of K+ inward rectifier in maize coleoptile protoplasts. Planta 208:38–45
3. Hager A (2003) Role of the plasma membrane H+-ATPase in auxin-induced elongation growth: historical and new aspects. J Plant Res 116:483–505
4. Batelli G, Verslues PE, Agius F, Qiu Q, Fujii H, Pan S et al (2007) SOS2 promotes salt tolerance in part by interacting with the vacuolar H+-ATPase and upregulating its transport activity. Mol Cell Biol 27:7781–7790
5. Shabala L, Cuin TA, Newman IA, Shabala S (2005) Salinity-induced ion flux patterns from the excised roots of Arabidopsis sos mutants. Planta 222:1041–1050
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. AtCIPK16, a CBL-interacting protein kinase gene, confers salinity tolerance in transgenic wheat;Frontiers in Plant Science;2023-03-16
2. Recent advances in solid-contact ion-selective electrodes: functional materials, transduction mechanisms, and development trends;Chemical Society Reviews;2020
3. Measurement of Extracellular Ion Fluxes Using the Ion-selective Self-referencing Microelectrode Technique;Journal of Visualized Experiments;2015-05-03
4. Cyclic mononucleotides modulate potassium and calcium flux responses to H2O2in Arabidopsis roots;FEBS Letters;2014-02-13
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3