1. W. F. Savage, E. F. Nippes andT. W. Miller,Weld. Res. Suppl. 55 (1976) 181-s.
2. W. F. Savage, E. F. Nippes andE. S. Szkeres,ibid. 55 (1976) 260-s.
3. Y. Shi andY. Zhang,Hanjie Xuebau 6 (1985) 177 (in Chinese).
4. J. R. Foulds andJ. Moteff,Weld. Res. Suppl. 61 (1982) 189-s.
5. D. Jerzy, in Proceedings of the 10th International Congress on Electron Microscopy, Vol 2, Hamburg, August, 1982, edited by the Congress Organising Committee (Deutsche Gesellschaft f�r Elektronenmikroskopie e.V., Frankfurt/Main, 1982) p. 159.