Author:
Ha Dong S.,Reddy Sudhakar M.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Spectral RTL Test Generation for Microprocessors;20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07);2007
2. Software-based self-testing methodology for processor cores;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2001-03
3. At-speed functional verification of programmable devices;19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.