Author:
,Berger Ch.,Fr�hlich M.,M�nch H.,Nisius R.,Raupach F.,Schleper P.,Benadjal Y.,Blum D.,Bourdarios C.,Dudelzak B.,Eschstruth P.,Jullian S.,Lalanne D.,Laplanche F.,Longuemare C.,Paulot C.,Perdereau O.,Roy Ph.,Szklarz G.,Behr L.,Degrange B.,Nguyen-Khac U.,Tisserant S.,Arpesella C.,Bareyre P.,Barloutaud R.,Borg A.,Chardin G.,Ernwein J.,Glicenstein J. F.,Mosca L.,Moscoso L.,Becker J.,Becker K. H.,Daum H. J.,Jacobi B.,Kuznik B.,L�ffler J.,Meyer H.,M�ller R.,Schubnell M.,Wei Y.,Wintgen P.
Publisher
Springer Science and Business Media LLC
Subject
Physics and Astronomy (miscellaneous),Engineering (miscellaneous),Physics and Astronomy (miscellaneous),Physics and Astronomy (miscellaneous)