Additive Processes for Polymeric Materials

Author:

Meng Ellis,Zhang Xin,Benard William

Publisher

Springer US

Reference472 articles.

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2. K.Y. Lee, N. LaBianca, S.A. Rishton et al.: Micromachining applications of a high resolution ultrathick photoresist, J. Vac. Sci. Technol. B 13, 3012–3016 (1995)

3. M. Despont, H. Lorenz, N. Fahrni et al.: High-aspect-ratio, ultrathick, negative-tone near-uv photoresist for MEMS applications. Proceedings of the IEEE Microelectromechanical Systems Conference, Nagoya, Japan, pp. 518–522 (1997)

4. J.M. Shaw, J.D. Gelorme, N.C. Labianca et al.: Negative photoresists for optical lithography, IBM J. Res. Dev. 41, 81–94 (1997)

5. N.C. LaBianca, J.D. Gelorme: High-aspect-ratio resist for thick-film applications. Proceedings of SPIE – The International Society for Optical Engineering, Santa Clara, CA, USA, pp. 846–852 (1995)

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