Backscattering Detector and EBSD in Nanomaterials Characterization-Reference-Cited by-同舟云学术

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Backscattering Detector and EBSD in Nanomaterials Characterization

Published:2006 Issue: Volume: Page:41-75
ISSN:
Container-title:Scanning Microscopy for Nanotechnology
language:
Short-container-title:

Author:

Maitland Tim,Sitzman Scott

Publisher

Springer New York

Link

http://link.springer.com/content/pdf/10.1007/978-0-387-39620-0_2.pdf

Reference15 articles.

1. T. M. Maitland, unpublished work (2005).

2. Figures 2.2–2.4, assistance of Robert Schwarzer is gratefully acknowledged.

3. K. Shinohara, Sci. Pap. Inst. Phys. Chem. Res., 20 (1932/1933) 39.

4. Boersch Physikalische Zeitschrift, 38 (1937) 1, 000.

5. M. N. Alam, M. Blackman, and D. W. Pashley, Proc. Roy. Soc., 221(1954) 224.

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