1. The relation between diffraction and images from planar defects has been the subject of a long series of papers from the group led by Prof. Severin Amelinckx. The examples below from Phys. stat. sol. will give you a start to your study.
2. Carter, CB (1984) Electron Diffraction from Microtwins and Long-Period Polytypes Phil. Mag. A 50 133–141. The Young’s slit experiment in the TEM.
3. de Ridder, R, Van Landuyt, J, Gevers, R and Amelinckx, S (1968) The Fine Structure of Spots in Electron Diffraction Resulting from the Presence of Planar Interfaces and Dislocations. IV. Wedge Crystals Phys. stat. sol. 30 797–815; See also: (1970) ibid. 38 747; (1970) ibid. 40 271; (1970) ibid. 41 519; (1970) ibid. 42 645.
4. Gevers, R (1971) in Electron Microscopy in Materials Science (Ed. U. Valdrè) p302–310, Academic Press, New York. An introduction to the work of Amelinckx’ group.
5. Gevers, R, Van Landuyt, J and Amelinckx, S (1966) The Fine Structure of Spots in Electron Diffraction Resulting from the Presence of Planar Interfaces and Dislocations. I. General Theory and Its Application to Stacking Faults and Anti-phase Boundaries Phys. stat. sol. 18 343–361; See also (1967) ibid. 21 393; (1967) ibid. 23 549; (1968) ibid. 26 577.