Studies on the electrical conductivity, optical absorption and x-ray diffraction in bismuth thin film-Reference-Cited by-同舟云学术

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Studies on the electrical conductivity, optical absorption and x-ray diffraction in bismuth thin film

Published:1998-03 Issue:3 Volume:50 Page:221-226
ISSN:0304-4289
Container-title:Pramana
language:en
Short-container-title:Pramana - J Phys

Author:

Jayachandran K,Menon C S

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF02847172.pdf

Reference7 articles.

1. J P Issi,Aust. J. Phys. 32, 585 (1979)

2. L Al Houty, M E Kaseem and H I Abdel Kader,J. Mater Sci. 6, 17 (1995)

3. V Damodara Das and N Soundararajan,Phys. Rev. B35, 5990 (1987)

4. R Atkinson and P H Lossberger,Thin Solid Films 17, 107 (1971)

5. S Tolansky,Multiple beam of interference microscope of metals (Academic Press, London, 1970)

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1. Nucleation and quantum confinement of nano-platelet Bi2–Bi2Se3;Journal of Vacuum Science & Technology A;2023-06-09

2. Hysteresis-like behaviour of the thermoelectric voltage in photovoltaic materials;Thin Solid Films;2006-07

3. Occurrence of hysteresis-like behavior of resistance of film in the dynamical measurement of heating–cooling cycle;Physica B: Condensed Matter;2005-05

4. Surface plasma waves over bismuth-vacuum interface;Pramana;2003-09

5. Hysteresis-like behavior of resistivity of thin films in heating–cooling cycle;Physics Letters A;2003-06

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