A second order approach to analyse spatial point patterns with functional marks
Author:
Publisher
Springer Science and Business Media LLC
Subject
Statistics, Probability and Uncertainty,Statistics and Probability
Link
http://link.springer.com/content/pdf/10.1007/s11749-010-0215-1.pdf
Reference30 articles.
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2. Daley DJ, Vere-Jones D (2004) An introduction to the theory of point processes, 2nd edn. Springer, New York
3. Diggle PJ (1975) Robust density estimation using distance methods. Biometrika 62:39–48
4. Diggle PJ (2003) Statistical analysis of spatial point patterns. Hodder Arnold, Sevenoaks
5. Springer series in statistics;F Ferraty,2006
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