1. N. Mrad, R.G. Melton and B.T. Kulakowski J. of Intelligent Mater. Syst. Struct., 1997, 8 (11), 920–928.
2. L. Yuan and L. Zhou, Measurement Sci. & Tech., 1998, 9 (8), 1174–1179.
3. V.E. Saouma, D.Z. Anderson, K. Ostrander, B. Lee and V. Slowik, Mater. & Struct., 1998, 31 (208), 259–266.
4. G. Surace and A. Chiaradia, Proc. SPIE–Int. Soc. for Optical Eng., Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, 1997, 3041, 644–650.
5. N. Takeda and T. Kosaka, Proc. SPIE–Int. Soc. for Optical Eng., Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, 1997, 3041, 635–643.