1. Vashchenko VA, W. Kindt, M. ter Beek, and P. Hopper “Implementation of 60 V Tolerant Dual Direction ESD Protection in 5 V BiCMOS Process for Automotive Application”, in Proceedings of ESD/EOS Symposium, 2004, pp.117-124.
2. Wang K, et al. (2004) Characterization of human metal ESD reference discharge event and correlation of generator parameters to failure levels – part II: Correlation of generator parameters to failure levels. IEEE Trans EMC 46(4):505–511.
3. Sze S (1981) Physics of Semiconductor Devices. Wiley, New York, NY.
4. Mergens M, Mayerhofer MT, Willemen JA, Stecher M (2006) ESD protection considerations in advanced high-voltage technologies for automotive. Proc. EOSESD, 54.
5. Davidson S (2006) Searching for clues: diagnosing IC failures. IEEE Design Test Comput 23(1):67–68.