1. Concannon A, Vashchenko VA, ter Beek M, Hopper P (2003) A device level negative feedback in the emitter line of SCR-structures as a method to realize latch-up free ESD protection. 41st Annual 2003 IEEE International Reliability Physics Symposium Proceedings, 30 March–4 April 2003, 105–111 .
2. Voldman SH (2004) ESD Physics and Devices. Wiley, Chichester.
3. Russ C, Mergens M, Verhaege K, et al. (2001) GGSCRs: GGNMOS triggered silicon controlled rectifiers for ESD protection in deep sub-micron CMOS processes. Proc. EOS/ESD Symp., pp. 22–31.
4. Kerner BS, Osipov VV (1994) Autosolitons. A new approach to Problems of Self-Organization and Turbulence. Kluwer Academic Publishers, Dordrecht, Boston, London.
5. Dabral S, Maloney TJ (1998) Basic ESD and I/O Design. Wiley, West Sussex.