Author:
Ankenman Bruce E.,Bekki Jennifer M.,Fowler John,Mackulak Gerald T.,Nelson Barry L.,Yang Feng
Reference65 articles.
1. Agrawal A, Minis I, Nagi R (2000) Cycle time reduction by improved MRP-based production planning. Int J Prod Res 28:4823–4841.
2. Asmundsson J, Rardin RL, Uzsoy R (2006) Tractable nonlinear production planning models for semiconductor wafer fabrication facilities. IEEE Trans Semicond Manufact 19:95–111.
3. Atherton RW, Dayhoff JE (1986) Signature analysis: simulation of inventory, cycle time and throughput trade-offs in wafer fabrication. IEEE Trans Components Hybrids Manufact Technol 9(4):498–507.
4. Barton RR (1998) Simulation metamodels. In: Medeiros DJ, Watson EF, Carson JS, Manivannan MS (eds) Proceedings of the 1998 winter simulation conference. IEEE, Piscataway, New Jersey, pp 167–174.
5. Barton RR, Meckesheimer M (2006) Metamodel-based simulation optimization. In: Henderson SG, Nelson BL (eds) Handbook in OR & MS 13. Elsevier, North Holland, pp 535–574.
Cited by
22 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献