Circuit and System Level Single-Event Effects Modeling and Simulation-Reference-Cited by-同舟云学术

Circuit and System Level Single-Event Effects Modeling and Simulation

Published:2010-08-23 Issue: Volume: Page:103-140
ISSN:0929-1296
Container-title:Soft Errors in Modern Electronic Systems
language:
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Author:

Alexandrescu Dan

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4419-6993-4_5.pdf

Reference60 articles.

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2. “Satellite Anomalies from Galactic Cosmic Rays”. Binder, D., Smith, E.C. and Holman, A.B. 1975, IEEE Transactions on Nuclear Science, Vols. NS-22, No. 6, pp. 2675–2680.

3. “Single Event Upsets in Implantable Cardioverter Defibrillators”. Bradley, P.D. and Normand, E. 1998, IEEE Transactions on Nuclear Science, Vol. 45, No. 6, p. 2929.

4. “Circuit Simulations of SEU and SET Disruptions by Means of an Empirical Model Built Thanks to a Set of 3D Mixed-Mode Device Simulation Responses”. Belhaddad, H., et al. 2006, RADECS2006.

5. “A New Approach for the Prediction of the Neutron-Induced SEU Rate”. Vial, C., et al. 1998, IEEE Transactions on Nuclear Science, Vol. 45, No. 6, p. 2915.

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