Solutions to Improve the Reliability of On-Chip Interconnects

Author:

Fu Bo,Ampadu Paul

Publisher

Springer New York

Reference55 articles.

1. Agarwal K, Sylvester D, Blaauw D (2006) Modeling and analysis of crosstalk noise in coupled RLC interconnects. IEEE Trans Computer-Aided Des Integr Circuits Syst 5:892–901

2. Massoud Y (2002) Managing on-chip inductive effects. IEEE Trans Very Large Scale Integr (VLSI) Syst 6:789–798

3. Huang X, Cao Y, Sylvester D et al (2000) RLC signal integrity analysis of high-speed global interconnects. In: Proceedings of IEEE international electron devices meeting (IEDM), pp 731–743

4. Zhang J, Friedman GE (2004) Effect of shield insertion on reducing crosstalk noise between coupled interconnects. In: Proceedings of IEEE international symposium on circuits and system (ISCAS), pp 529–532

5. Lepak MK, Xu M, Chen J, He L (2004) Simultaneous shielding insertion and net ordering for capacitive and inductive coupling minimization. ACM Trans Des Autom Electron Syst 3:290–309

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