Author:
Krivanek Ondrej L.,Chisholm Matthew F.,Dellby Niklas,Murfitt Matthew F.
Reference97 articles.
1. N. Alem, R. Erni, C. Kisielowski, M.D. Rossell, W. Gannett, A. Zettl, Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy. Phys. Rev. B80, 155425 (2009)
2. G.D. Archard, Two new simplified systems for the correction of spherical aberration in electron lenses. Proc. R. Soc. B68, 156–164 (1955)
3. M. von Ardenne, in The Beginnings of Electron Microscopy. Advances in Electronics and Electron Physics, ed. by P.W. Hawkes, Suppl. 16 (Academic, London, 1985), pp. 1–21
4. M. von Ardenne, Das Elektronen-Raster Mikroskop (The scanning electron microscope). Z. Tech. Phys 19, 407–416 (1938)
5. M. von Ardenne, Elektronen Übermikroskopie (Springer, Berlin, 1940)
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献