Nanoscale Deformation and Strain Analysis by AFM/DIC Technique
-
Published:2009-12-04
Issue:
Volume:
Page:695-718
-
ISSN:
-
Container-title:Nano-Bio- Electronic, Photonic and MEMS Packaging
-
language:
-
Short-container-title:
Author:
Sun Y. F.,Pang John H.L.
Reference18 articles.
1. W. H. Peters and W. F. Ranson, Digital imaging techniques in experimental stress analysis, Opt. Eng. (1982), 21, 427–432. 2. M. A. Sutton, W. J. Wolters, W. H. Peters, W. F. Ranson, and S. R. McNeil, Determination of displacements using an improved digital image correlating method, Image. Vis. Comput. (1983), 1, 133–139. 3. T. C. Chu, W. F. Ranson, M. A. Sutton, and W. H. Peters, Applications of digital image correlation techniques to experimental mechanics, Exp. Mech. (1985), 25, 234–244. 4. S. Murray, C. J. Gillham, and A. H. Windle, Characterization and correction of distortions encountered in scanning electron micrographs, J. Phys. E: Sci. Instrum. (1973), 6, 381–384. 5. I. Suganuma, A novel method for automatic measurement and correction of astigmatism in the SEM, J. Phys. E: Sci. Instrum. (1987), 20, 67–73.
|
|