1. S.B. Park, Y.W. Kim, Y.G. Ko, K.I. Kim, I.K. Kim, H.S. Kang, J.O. Yu, K.P. Suh, IEEE Journal of Solid-State Circuits, Vol. 34, p. 1436, 1999
2. M. Canada, C. Akroul, D. Cawlthron, J. Corr, S. Geissler, R. Houle, P. Kartschoke, D. Kramer, P. McCormick, N. Rohrer, G. Salem, L. Warriner, IEEE International Solid-State Circuits Conference, Digest of Technical Papers, p. 430, 1999
3. A.G. Aipperspach, D.H. Allen, D.T. Cox, N.V. Phan, S.N. Storino, IEEE Journal of Solid-State Circuits, Vol. 34, p. 1430, 1999
4. S. Geissler, D. Appenzeller, E. Cohen, S. Charlebois, P. Kartschoke, P. McCormick, N. Rohrer, G. Salem, P. Sandon, B. Singer, T. Von Reyn, J. Zimmerman, IEEE International Solid-State Circuits Conference, Digest of Technical Papers, Part Vol. 1, p. 148, 2002
5. C.N. Keltcher, K.J. McGrath, A. Ahmed, P. Conway, IEEE Micro, Vol. 23, no. 2, p. 66, 2003