Author:
Balakrishnan Narayanaswamy,Mitra Debanjan,Zhu Xiaojun
Reference42 articles.
1. Nelson, W.B.: Accelerated life testing: step-stress models and data analysis. IEEE Trans. Reliab. 29, 103–108 (1980)
2. Nelson, W.B.: Accelerated Life Testing, Statistical Models, Test Plans and Data Analysis. John Wiley and Sons, New York (1990)
3. Nelson, W.B., Meeker, W.Q.: Theory for optimum accelerated censored life tests for Weibull and extreme value distributed. Technometrics 20, 171–177 (1978)
4. Meeker, W., Hahn, G.: How to Plan Accelerated Life Tests: Some Practical Guidelines. The ASQC Basic References in Quality Control, Wisconsin (1985)
5. Meeker, W.Q., Escobar, L.A.: Statistical Methods for Reliability Data. John Wiley and Sons, New York (1998)