Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits
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Publisher
Springer US
Link
http://link.springer.com/content/pdf/10.1007/978-1-4419-0931-2_2.pdf
Reference20 articles.
1. Q. Zhou and K. Mohanram, “Gate sizing to radiation harden combinational logic,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 25, no. 1, pp. 155–166, Jan. 2006.
2. K. Mohanram and N. A. Touba, “Cost-effective approach for reducing soft error failure rate in logic circuits,” in Proc. of the Intl. Test Conf., 2003, pp. 893–901.
3. T. Heijmen and A. Nieuwland, “Soft-error rate testing of deep-submicron integrated circuits,” in Proc. of the IEEE European Test Symposium, 2006, pp. 247–252.
4. K. Mohanram, “Closed-form simulation and robustness models for SEU-tolerant design,” in Proc. of the VLSI Test Symposium, 2005, pp. 327–333.
5. P. Dahlgren and P. Liden, “A switch-level algorithm for simulation of transients in combinational logic,” in Proc. of the Intl. Symposium on Fault-Tolerant Computing, June 1995, pp. 207–216.
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