Author:
Bhushan Manjul,Ketchen Mark B.
Cited by
23 articles.
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1. A Test IC for Wafer-Level Characterization of an IntraCMOS-MEMS Fabrication Process;IEEE Latin America Transactions;2022-01
2. Measurement of the Large-Signal Propagation Delay of Single Transistors;RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors;2021-12-16
3. Contactless scribe-test monitor with photovoltaic power, VLC downlink and IR-UWB uplink;Analog Integrated Circuits and Signal Processing;2021-05-08
4. On-chip Test Acceleration for Advanced Technologies;2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2021-04-08
5. MOSFET C-V Characteristics Extraction Based on Ring Oscillator with Addressable DUTs;2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2021-04-08