Multi-Frequency Atomic Force Microscopy
Author:
Publisher
Springer New York
Link
http://link.springer.com/content/pdf/10.1007/978-1-4419-7167-8_5.pdf
Reference64 articles.
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4. R.W. Stark, T. Drobek, and W.M. Heckl, “Tapping-mode atomic force microscopy and phase-imaging in higher eigenmodes,” Applied Physics Letters 74 (22), 3296–3298 (1999).
5. O. Sahin and A. Atalar, “Simulation of higher harmonics generation in tapping-mode atomic force microscopy,” Applied Physics Letters 79 (26), 4455–4457 (2001).
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