Fine-particle characterization by rietveld QXRD, CLM, and SEM-EDS phase mapping

Author:

Hagni Ann M.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering,General Materials Science

Reference8 articles.

1. D.L. Bish and S.A. Howard, “Quantitative Phase Analysis Using the Rietveld Method,”J. Applied Crystallography, 21 (1988), pp. 86–91.

2. I.C. Madsen et al., “Outcomes of the International Union of Crystallography Commission on Powder Diffraction Round Robin on Quantitative Phase Analysis: Samples 1a to 1h,”J. Applied Crystallography, 34 (2001), pp. 409–426.

3. A.M. Hagni, “Aluminum-Silicon-Boron Carbide Metal Matrix Composite Materials Characterization,”Studies on Ore Deposits, Mineral Economics, and Applied Mineralogy: With Emphasis on Mississippi Valley-type Base Metal and Carbonatite-related Ore Deposits, ed. R.D. Hagni (Rolla, MO: University of Missouri-Rolla Press, 2001), pp. 407–412.

4. M. Pagel et al., editors,Cathodoluminescence in Geosciences (Berlin: Springer, 2000).

5. R.D. Hagni and A.M. Hagni, “The Importance of Ore Microscopy and Cathodoluminescence Microscopy in the Study of Selected Environmental Problems,”Applied Mineralogy: Proceedings of the 5th International Congress on Applied Mineralogy in the Minerals Industry (Warsaw, Poland: Warsaw University of Technology, 1997), pp. 28–35.

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