Author:
Kofler Corinna,Rosa Francisco López de la,Zarre Dominic,Guglielmo Gianluca,Dohr Claudia Anna,Dohr Judith,Zernig Anja,Fernández-Caballero Antonio
Publisher
Springer International Publishing
Reference20 articles.
1. Van Zant, P. (2014). Microchip fabrication. McGraw-Hill Education.
2. Zhou, W., Apkarian, R., Wang, Z. L., & Joy, D. (2007). Fundamentals of scanning electron microscopy (SEM). In Scanning microscopy for nanotechnology: Techniques and applications (pp. 1–40)
3. Vernon-Parry, K. D. (2000). Scanning electron microscopy: An introduction. III-Vs Review, 13(4), 40–44.
4. Kannan, M. (2018). Scanning electron microscopy: Principle, components and applications. In A textbook on fundamentals and applications of nanotechnology (pp. 81–92). Springer.
5. Leevy, J. L., Khoshgoftaar, T. M., Bauder, R. A., & Seliya, N. (2018). A survey on addressing high-class imbalance in big data. Journal of Big Data, 5(1), 1–30.