Publisher
Springer International Publishing
Reference16 articles.
1. K. A. Jenkins, J. Y. Sun and J. Gautier, "Characteristics of SOI FET’s under pulsed conditions," IEEE Transactions on Electron Devices, Vol. 44, vol.. 11, pp. 1923-1930, Nov. 1997, DOI: https://doi.org/10.1109/16.641362.
2. L. T. Su, J. E. Chung, D. A. Antoniadis, K. E. Goodson and M. I. Flik, "Measurement and modeling of self-heating in SOI nMOSFET’s," IEEE Transactions on Electron Devices, vol. 41, no. 1, pp. 69-75, Jan. 1994, DOI: https://doi.org/10.1109/16.259622.
3. CT1, CT2, and CT6, products of Tektronix, Inc, Beaverton, OR, www.Tek.com
4. 4225-PMU, product of Keithley Instruments, Tektronix Inc., Beaverton, OR, www.tek.com.
5. B1530 WGFMU, product of Keysight Technologies Inc., Santa Rosa, CA, www.keysight.com.