1. The European X-Ray Laser Project XFEL
,
http://xfel.desy.de/
2. Fretwurst, E., et al.: Study of the Radiation Hardness of Silicon Sensors for the XFEL, poster presented at IEEE NSS 2008, Dresden, Germany, Conference record N30–400
3. Zhang, J., et al.: Study of high-dose X-ray radiation damage of Si sensors. Nucl. Instr. Methods Phys. Res. A. 732, 117–121 (2013)
4. Göttlicher, P., et al. (AGIPD collaboration): The Adaptive Gain Integrating Pixel Detector (AGIPD): A Detector for the European XFEL: Development and Status, poster presented at IEEE NSS 2009, Orlando, Florida, USA, N25–239
5. Synopsys, Inc., TCAD software.
http://www.synopsys.com/Tools/TCAD/DeviceSimulation/