Testing and Verification of the Deep Neural Networks Against Sparse Pixel Defects
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Publisher
Springer International Publishing
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-14862-0_4
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5. Chapman, G.H., Leung, J., Namburete, A., Koren, I., Koren, Z.: Predicting pixel defect rates based on image sensor parameters. In: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp. 408–416 (2011)
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