Author:
Alam Irina,Dolecek Lara,Gupta Puneet
Abstract
AbstractReliability of the memory subsystem is a growing concern in computer architecture and system design. From on-chip embedded memories in Internet-of-Things (IoT) devices and on-chip caches to off-chip main memories, the memory subsystems have become the limiting factor in the overall reliability of computing systems. This is because they are primarily designed to maximize bit storage density; this makes memories particularly sensitive to manufacturing process variation, environmental operating conditions, and aging-induced wearout. This chapter of the book focuses on software managed techniques and novel error correction codes to opportunistically cope with memory errors whenever they occur for improved reliability at minimal cost.
Publisher
Springer International Publishing
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