A SEU Immune Flip-Flop with Low Overhead
Author:
Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-62460-6_6
Reference34 articles.
1. Baumann, R.C.: Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans. Device Mater. Rel. 5, 305 (2005)
2. Akkerman, A., et al.: Role of elastic scattering of protons, muons, and electrons in inducing single-event upsets. IEEE Trans. Nucl. Sci. 64, 2648 (2017)
3. Caron, P., et al.: Physical mechanisms inducing electron single-event upset. IEEE Trans. Nucl. Sci. 65, 1759 (2018)
4. Aibin, Y., et al.: Quadruple cross-coupled dual-interlocked-storage-cells-based multiple-node-upset-tolerant latch designs. IEEE Trans. Circuits Syst. I: Regul. Papers 67(3), 879–890 (2020)
5. Mongkolkachit, P., Bhuva, B.: Design technique for mitigation of alpha-particle-induced single-event transients in combinational logic. IEEE Trans. Device Mater. Rel. 3, 89 (2003)
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