Second Round of Comparison Tests for High-Current Shunts in High-Power Laboratories in Asia and North America with an STL Reference Shunt

Author:

Goda Yutaka,Kim Minkyu,Wang An,Agrawal Yugal,DeCesaro Frank P.

Publisher

Springer International Publishing

Reference4 articles.

1. Lathouwers, A., et al.: Traceability of very high current measurements: the STL procedure for high power laboratories. In: Proceedings of ISH 2005, Beijing (2005)

2. Kawamura, T., Haginomori, E., Goda, Y., Nakamoto, T.: Recent developments on high current measurement using current shunt. IEEJ Trans. 2(5), 516–522 (2007)

3. Goda, Y., Kim, M., Wang, A., Sengupta, G.: Comparison tests of high current shunts in high power laboratories in Asia with an STL reference shunt. In: 2012 IEEE Power & Energy Society Transmission and Distribution Conference and Exposition (2012)

4. IEC 62475 Ed. 1.0. High-current test techniques: definition and requirements for test currents and measuring systems (2010)

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