Different Structural Parameters Impacted on the Rough Surfaces Contact Force and Area Between the Base and the Magnetic Film Cantilever

Author:

Chen Ying,Wang Yi-Fei

Publisher

Springer Nature Switzerland

Reference16 articles.

1. Quandt, E., Gerlach, B., Seemann, K.: Preparation and applications of magnetostrictive thin films. Appl. Phys. 76(10), 7000–7002 (2008)

2. Xu, C.: Research on Cantilever Magnetic Field Sensor Based on Giant Magnetostriction Film. China Jiliang University (2020)

3. Klokholm, E.: The measurement of magnetostriction in ferromagnetic thin films. IEEE Trans. Magn. 12(6), 819–821 (1976)

4. Zhang, W.X., Peng, B., Jiang, H.C., et al.: Influence of film thickness on deformation of a free magnetostrictive film-substrate system. Magn. Mat. 247(1), 111–116 (2002)

5. Yun, G.H., Narsu, B.: Mechanical characteristics of a giant magnetostrictive film-substrate cantilever system. Nanotechnol. Precis. Eng. 6(1), 29–33 (2008)

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