Author:
Copetti Thiago Santos,Gemmeke Tobias,Poehls Leticia Maria Bolzani
Publisher
Springer Nature Switzerland
Reference28 articles.
1. Moore, G.E.: Cramming more components onto integrated circuits with unit cost. Electronics 38(8), 114 (1965). https://newsroom.intel.com/wp-content/uploads/sites/11/2018/05/moores-law-electronics.pdf
2. Dennard, R., Gaensslen, F., Yu, W.-N., Rideout, L., Bassous, E., Le Blanc, A.: Design of ion-implanted small MOSFET. S dimensions with very. IEEE J. Solid State Circ. 9(5), 257–268 (1974)
3. Hamdioui, S., et al.: Memristor for computing: myth or reality? In: Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. Institute of Electrical and Electronics Engineers Inc., pp. 722–731 (2017)
4. Mazumder, P., Kang, S.M., Waser, R.: Memristors: devices, models, and applications. Proc. IEEE 100(6), 1911–1919 (2012)
5. Chaudhuri, A., Chakrabarty, K.: Analysis of process variations, defects, and design-induced coupling in memristors. In: 2018 IEEE International Test Conference (ITC), pp. 1–10 (2018)
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Online Detection of Unique Faults in RRAMs;2024 IEEE European Test Symposium (ETS);2024-05-20