Author:
Xie Xinwen,Carré Philippe,Perrine Clency,Pousset Yannis,Wu Jianhua,Zhou Nanrun
Publisher
Springer International Publishing
Reference19 articles.
1. Wang, Z., Bovik, A.C., Sheikh, H.R., Simoncelli, E.P.: Image quality assessment: from error visibility to structural similarity. IEEE Trans. Image Process. 13, 600–612 (2004)
2. Wang, Z., Simoncelli, E.P., Bovik, A.C.: Multiscale structural similarity for image quality assessment. In: Conference Record of the Thirty-Seventh Asilomar Conference on Signals, Systems and Computers, vol. 1392, pp. 1398–1402 (2004)
3. Zhang, L., Zhang, L., Mou, X., Zhang, D.: FSIM: a feature similarity index for image quality assessment. IEEE Trans. Image Process. 20, 2378–2386 (2011)
4. Wang, Z., Simoncelli, E.P.: Reduced-reference image quality assessment using a wavelet-domain natural image statistic model. In: Human Vision and Electronic Imaging X, pp. 149–160. International Society for Optics and Photonics (2005)
5. Dufaux, F., Nicholson, D.: JPWL: JPEG 2000 for wireless applications. In: Applications of Digital Image Processing XXVII, pp. 309–319. International Society for Optics and Photonics (2004)