Research on Lens Design for LED Source of Microscopic Measuring System
Author:
Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-04290-5_2
Reference14 articles.
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4. Paul Kumar, U., Haifeng, W., Krishna Mohan, N., Kothiyal, M.P.: White light interferometry for surface profiling with a color CCD. Opt. Lasers Eng. 50, 1084–1088 (2012)
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