Atomic Force Microscopy: An Advanced Imaging Technique—From Molecules to Morphologies
Author:
Publisher
Springer International Publishing
Link
https://link.springer.com/content/pdf/10.1007/978-3-030-99542-3_5
Reference24 articles.
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2. Young R, Ward J, Scire F (1972) The Topografiner: an instrument for measuring surface microtopography. Rev Sci Instrum 43(7):999–1011. https://doi.org/10.1063/1.1685846
3. Binnig G, Quate CF, Gerber C (1986) Atomic force microscope. Phys Rev Lett 56(9):930–933. https://doi.org/10.1103/PhysRevLett.56.930
4. Martin Y, Williams CC, Wickramasinghe HK (1987) Atomic force microscope–force mapping and profiling on a sub 100-Å scale. J Appl Phys 61(10):4723–4729. https://doi.org/10.1063/1.338807
5. Nguyen-Tri P, Ghassemi P, Carriere P, Nanda S, Assadi AA, Nguyen DD (2020) Recent applications of advanced atomic force microscopy in polymer science: a review. Polymers 12(5). https://doi.org/10.3390/polym12051142
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