1. Y. Kimoto, N. Nemoto, H. Matsumoto, et al., Space radiation environment and its effects on satellites: analysis of the first data from TEDA on board ADEOS-II. IEEE Trans. Nucl. Sci.52(5),1574–1578 (2005)
2. EIA/JESD57, Test Procedures for the Manegement of Single-Event Effects in Semiconductor Devices from Heavy-Ion Irradiation (EIA/JEDEC Standard, Nov. 2017, available at:
https://www.jedec.org/standards-documents/docs/jesd-57
)
3. ASTM F 1192-11, Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices (ASTM Standard, West Conshohocken, PA, 2006)
4. MIL-STD-750-1, Environmental Test Methods for Semiconductor Devices (Department of Defense Test Method Standard, USA, 2012)
5. ESCC Basic Specification No. 25100, Single Event Effect Test Methods and Guidelines (Eurupean Space Agency, available at
https://escies.org
)