The Ionizing Radiations Effects in Electrical Parameters and Figures of Merit of Mosfets
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Publisher
Springer International Publishing
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-29086-2_7
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4. Ziegler, J. F., Curtis, H. W., Muhlfeld, H. P., Montrose, C. J., Chin, B., Nicewicz, M., Russell, C. A., Wang, W. Y., Freeman, L. B., Hosier, P., et al. (1996). IBM experiments in soft fails in computer electronics (1978–1994). IBM Journal of Research and Development, 40, 3–18. https://doi.org/10.1147/rd.401.0003
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