Applicability Criterion of the Non Overlapping Template Matching Algorithm from NIST Statistical Test Suite SP800-22 for Long Aperiodic Patterns

Author:

Jóźwiak Piotr PawełORCID,Zatwarnicki KrzysztofORCID

Publisher

Springer Nature Switzerland

Reference14 articles.

1. Knuth, D.E.: The Art of Computer Programming. Vol 2: Seminumerical Algorithms. Addison-Wesley, USA (1997)

2. CCIS;PP Jóźwiak,2023

3. Rukhin, A., et al.: A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications. National Institute of Standards and Technology, Special Publication 800-22, Rev.1a (2010)

4. Sys, M., Riha, Z., Matyas, V., Marton, K., Suciu, A.: On the interpretation of results from the NIST statistical test suite. Roman. J. Inf. Sci. Technol. 18(1), 18–32 (2015)

5. Kaikai, L., Jianguo, Z., Pu, L., Anbang, W., Yuncai, W.: Parallel implementation of the non-overlapping template matching test using CUDA. China Commun. 17(8) (2020)

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